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Electron microscope Product List

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[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors

[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors

Clearly observable structure of the diffusion layer including pn junction determination.

It is possible to observe in detail from an overview of the NPN bipolar transistors within commercially available LSI to an enlarged view of the emitter section. This is an example where a cross-section passing through the center of the emitter electrode was exposed, and AFM observation and SCM measurement were conducted. By overlaying the AFM image, the positional relationship with the wiring becomes clear.

  • Contract Analysis
  • Electron microscope

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Technical Information Magazine 201910-02 DDS Technology

Technical Information Magazine 201910-02 DDS Technology

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In recent years, research and development have been focused on drug delivery systems (DDS) aimed at reducing side effects of pharmaceuticals and improving their efficacy. Carriers used in DDS include biomaterials such as liposomes, polymer micelles, inorganic nanoparticles, and drug conjugates (e.g., ADCs). Among these, our company is concentrating on establishing analysis and evaluation techniques for liposomes, introducing case studies of liposome analysis primarily using high-difficulty techniques such as TEM (transmission electron microscopy) and AFM (atomic force microscopy). **Table of Contents** 1. Introduction 2. Fundamental technologies of DDS and characteristics of various carriers 3. Case studies of liposome analysis and evaluation 4. Conclusion

  • Contract Analysis
  • Contract measurement
  • Technical and Reference Books
  • Electron microscope

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[Analysis Case] Evaluation of the Diffusion Layer of Power Transistors (DMOSFET)

[Analysis Case] Evaluation of the Diffusion Layer of Power Transistors (DMOSFET)

You can understand the positional relationship between the gate layer, source layer, and body layer.

We investigated the shape and positional relationship of the poly-Si gate, n-type source layer, and p-type body layer of commercially available power transistors (DMOSFETs). By overlaying AFM images, we can also understand the positional relationship with the gate.

  • Contract Analysis
  • Electron microscope

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[Analysis Case] Evaluation of Ion Implantation Damage Layer in Gallium Oxide Ga2O3

[Analysis Case] Evaluation of Ion Implantation Damage Layer in Gallium Oxide Ga2O3

Confirming the differences due to variations in annealing conditions after ion implantation.

Gallium oxide (Ga2O3) has a wider bandgap than SiC and GaN, and possesses excellent physical properties, making it a focus of attention as a material for power devices that can be expected to be high-efficiency and low-cost. Controlling impurity concentration and crystallinity, which influence the characteristics of the devices, is crucial for their development. This document presents the results of observations of the damage layer and changes in surface roughness caused by disturbances in the crystal structure due to ion implantation, under various annealing conditions. Measurement methods: TEM, AFM Product fields: Oxide semiconductors, power devices Analysis objectives: Shape evaluation, structural evaluation For more details, please download the document or contact us.

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  • Contract Analysis
  • Contract measurement
  • Electron microscope

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Contracted advanced analysis, measurement, and testing | From material evaluation to mechanism elucidation

Contracted advanced analysis, measurement, and testing | From material evaluation to mechanism elucidation

Utilizing preprocessing and analysis techniques to solve problems! Supporting development through various material analyses and evaluations.

Our company utilizes data analysis (AI/machine learning, etc.) to support the enhancement of product value and business improvement. Experts in material development, analysis, and data analysis will quickly resolve the challenges and issues at hand. A team of specialists will collaborate on projects to meet your needs in a one-stop manner. Please feel free to contact us when you require assistance. 【Main Equipment We Own】 ■ FE-TEM (3D, precession), FE-SEM, FE-EPMA ■ FT-IR, Raman, NMR, AFM, laser microscope ■ X-ray CT, XPS, XRF, XRD ■ TG/DTA (steam gasification), DSC ■ GC (MS), LC (MS), TOFMS, HPLC, IC, ICP, GPC, DART, AAS ■ Various magnetic measurement devices such as VMS *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Fuel Cells
  • Secondary Cells/Batteries
  • Electron microscope

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[Data] Case Study of Material System Analysis

[Data] Case Study of Material System Analysis

It is possible to prepare sections ranging from 30nm to 5μm! This document introduces several case studies of material analysis!

This document is a collection of case studies summarizing material analysis conducted by Hanai Corporation's Electron Microscope Technology Research Institute. The "Ultra Microtome" is suitable for producing high-quality ultra-thin sections and cross-sections across a wide range of fields, including biological tissues, metal plating layers, inorganic deposition layers, and nanoparticles. Our company has started offering contract analysis services. We will conduct material analysis in collaboration with partner organizations. [Published Cases] - Structural analysis of liposomes - Structural analysis of HIPS - Structural analysis of lens cross-sections - Cross-sectional observation of candy bags - Morphological observation of metal particles using the dispersion method (metal microparticles/metal-supported carbon) *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Electron microscope
  • Other microscopes
  • Electron microscope

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